Supported Targets	ESP32	ESP32-C2	ESP32-C3	ESP32-C5	ESP32-C6	ESP32-C61	ESP32-H2	ESP32-P4	ESP32-S2	ESP32-S3

fatfs component target tests

This directory contains tests for fatfs component which are run on chip targets.

See also test_fatfs_host directory for the tests which run on a Linux host.

Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:

• sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
• flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
• flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash
• dyn_buffers - check if enabling dynamic buffers in FATFS has an effect

These test apps define:

• test functions
• setup/teardown routines
• build/test configurations
• pytest test runners

The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.